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演講公告
  • 標題:Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes
  • 公告日期:2017-03-10

 

Speaker: 蔡宗儒教授(淡江大學統計學系)


Title:
Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes.

Time: 16:10–17:00, Monday, April 24, 2017

Venue: Room 070221, 2F, Zhixi Building (志希樓2 樓e 化教室)

Refreshment: Refreshments will be served in Faculty Lounge 30 minutesbefore the talk.

Abstract: An accelerated degradation test (ADT) can be used to assess
the reliability of highly reliable products by using degradation
information. In this study, to exhibit a monotone increasing
pattern, the gamma process is used to model the degradation
of a product subject to a constant-stress ADT of two loadings.
Maximum likelihood estimates (MLEs) of the parameters of
the ADT model were obtained. Given a budget for the total
cost, an optimal ADT procedure was established to minimize
the asymptotic variance of the MLE of the mean time to failure
of a product, and the sample size and termination time of each
run of the ADT at a constant measurement frequency were determined.
An algorithm is provided to achieve an optimal ADT
plan. An extensive Monte Carlo simulation was implemented
to evaluate the sensitivity of the MLE variations to the sample
size. A lumen degradation data set of light emitting diodes is
presented to illustrate the proposed method.
This is a joint work with W-Y Sung, YL Lio, S Chang and J-C Lu.

  • 附件檔案: 演講公告 Adobe PDF
  • 參考連結:
  • 張貼人:guavawei
  • 最後修改時間:2017-03-10 PM 12:00

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